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X-Ray Diffraction Imaging: Technology and Applications
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X-Ray Diffraction Imaging: Technology and Applications Hardcover -

by Joel Greenberg (Editor); Krzysztof Iniewski (Editor)


Details

  • Title X-Ray Diffraction Imaging: Technology and Applications
  • Author Joel Greenberg (Editor); Krzysztof Iniewski (Editor)
  • Binding Hardcover
  • Pages 256
  • Volumes 1
  • Language ENG
  • Publisher CRC Press
  • ISBN 9781498783613 / 1498783619
  • Library of Congress subjects Radiography, Industrial, Refractometers
  • Library of Congress Catalog Number 2018027858
  • Dewey Decimal Code 620.112

About the author

Joel A. Greenberg received his B.S.E. in Mechanical and Aerospace Engineering from Princeton University in 2005, and his Ph.D. in physics from Duke University in 2012. He then joined the Duke Imaging and Spectroscopy Program in 2012 as a research scientist and technical/project manager of the computational adaptive X-ray imaging (CAXI) program. Since 2014, Joel has been an Assistant Research Professor of Electrical and Computer Engineering at Duke University and a member of the Fitzpatrick Institute for Photonics. He has published over 30 papers in the areas of nonlinear optics, cold atom physics, compressed sensing and X-ray imaging. His current research focuses on computational sensing and its application to security, medical, and industrial imaging and detection.

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X RAY DIFFRACTION IMAGING (HB 2019)
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