Description:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1993. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 93CH31492. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '93), PROCEEDINGS OF IEEE INTERNATIONAL, 20-23 September 1993, San Antonio, Texas. Hardcover - 1993
by IEEE
Details
- Title AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '93), PROCEEDINGS OF IEEE INTERNATIONAL, 20-23 September 1993, San Antonio, Texas.
- Author IEEE
- Binding Hardcover
- Edition 1st Edition
- Publisher The Institute of Electrical and Electronic Engineers, Inc., New York, NY, U.S.A.
- Date 1993
- ISBN 9780780306479
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Stock Photo: Cover May Be Different
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '93), PROCEEDINGS OF IEEE INTERNATIONAL, 20-23 September 1993, San Antonio, Texas.
by IEEE
- Used
- very good
- Hardcover
- first
- Condition
- Used - Very Good
- Edition
- 1st Edition.
- Binding
- Hardcover
- ISBN 13
- 9780780306479
- ISBN 10
- 0780306473
- Quantity Available
- 1
- Seller
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NEWARK, Ohio, United States
- Item Price
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A$74.66A$8.56 shipping to USA
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