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Metrology, Inspection & Process Control for Microlithography XI: 10-12 March
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Metrology, Inspection & Process Control for Microlithography XI: 10-12 March 1997 Santa Clara, California (Proceedings of Spie) 1997

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  • Title Metrology, Inspection & Process Control for Microlithography XI: 10-12 March 1997 Santa Clara, California (Proceedings of Spie)
  • Author n/a
  • Binding unknown
  • Language ENG
  • Publisher Society of Photo Optical
  • Publication date 1997
  • ISBN 9780819424648

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Metrology, Inspection, and Process Control for Microlithography XI:  10-12 March, 1997, Santa...
Stock photo: cover may vary

Metrology, Inspection, and Process Control for Microlithography XI: 10-12 March, 1997, Santa Clara, California [SPIE Proceedings, Volume 3050]

by Jones, Susan K., ed.

  • Used
  • Very good
  • Paperback
Condition
Very good
Binding
Paperback
ISBN 10 / ISBN 13
9780819424648 / 0819424641
Quantity available
1
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Item price
A$28.63
A$7.86 Delivery to USA

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Description:
International Society for Optical Engineering (SPIE), Bellingham, Wash, 1997. Paperback. Very Good. 4to, paperback. Vg condition. Ex-lib copy w/ light markings to opening pgs, spine label neatly removed; corner of cover & few pgs creased, contents clean, binding tight. x, 636 p. Co-sponsored by Semiconductor Equipment and Materials International.
Add to wish list
Item price
A$28.63
A$7.86 Delivery to USA