Automatic Testing Conference

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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '98), PROCEEDINGS OF IEEE INTERNATIONAL, 25-27 August 1998, Salt Lake City, Utah.

by IEEE

Condition
Used - Very Good
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No Jacket
Edition
1st Edition.
Published
1998
Binding
Hardcover
ISBN 10
0780344219
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NEWARK, Ohio, USA
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1998. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 98CH36179. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
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A$65.27
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '88), PROCEEDINGS OF IEEE INTERNATIONAL, 4-6 October 1988, Minneapolis, Minnesota.

by IEEE

Condition
Used - Very Good
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Edition
1st Edition.
Published
1988
Binding
Hardcover
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1
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NEWARK, Ohio, USA
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A$46.62

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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1988. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 88CH25759. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$46.62
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '96), PROCEEDINGS OF IEEE INTERNATIONAL, 16-19 September 1996, Dayton, Ohio.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1996
Binding
Hardcover
ISBN 10
0780333802
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1
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NEWARK, Ohio, USA
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A$55.95

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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1996. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 96CH35955. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$55.95
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '91), PROCEEDINGS OF IEEE INTERNATIONAL, 24-26 September 1991, Anaheim, California.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1991
Binding
Hardcover
ISBN 10
0879425776
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1
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NEWARK, Ohio, USA
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1991. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 91CH29413. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound Ex-Library Size: 4to.
Item Price
A$55.95
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '97), PROCEEDINGS OF IEEE INTERNATIONAL, 22-25 September 1997, Anaheim, California.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1997
Binding
Hardcover
ISBN 10
0780341635
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1
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NEWARK, Ohio, USA
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A$63.72

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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1997. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 97CH36120. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$63.72
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '95), PROCEEDINGS OF IEEE INTERNATIONAL, 8-10 August 1995, Atlanta, Georgia.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1995
Binding
Hardcover
ISBN 10
0780326229
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1
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NEWARK, Ohio, USA
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1995. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 95CH35786. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$65.27
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '93), PROCEEDINGS OF IEEE INTERNATIONAL, 20-23 September 1993, San Antonio, Texas.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1993
Binding
Hardcover
ISBN 10
0780306473
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1
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NEWARK, Ohio, USA
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Item Price
A$74.60

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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1993. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 93CH31492. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$74.60
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '92), PROCEEDINGS OF IEEE INTERNATIONAL, 21-24 September 1992, Dayton, Ohio.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1992
Binding
Hardcover
ISBN 10
0780306449
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1
Seller
NEWARK, Ohio, USA
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1992. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$55.95
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '90), PROCEEDINGS OF IEEE INTERNATIONAL, 17-20 September 1990, San Antonio, Texas.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1990
Binding
Hardcover
Quantity Available
1
Seller
NEWARK, Ohio, USA
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Item Price
A$41.96

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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1990. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 90CH27938. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$41.96
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '89), PROCEEDINGS OF IEEE INTERNATIONAL, 25-28 September 1989, Philadelphia, Pennsylvania.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1989
Binding
Hardcover
Quantity Available
1
Seller
NEWARK, Ohio, USA
Seller rating:
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Item Price
A$46.62

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Description:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1989. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 88CH25684. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$46.62
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '87), PROCEEDINGS OF IEEE INTERNATIONAL, 3-5 November 1987, San Francisco, California.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1987
Binding
Hardcover
Quantity Available
1
Seller
NEWARK, Ohio, USA
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
A$55.95

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Description:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1987. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 87CH25106. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$55.95
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '94), PROCEEDINGS OF IEEE INTERNATIONAL, 20-22 September 1994, Anaheim, California.

by IEEE

Condition
Used - Very Good
Jacket Condition
No Jacket
Edition
1st Edition.
Published
1994
Binding
Hardcover
Quantity Available
1
Seller
NEWARK, Ohio, USA
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
A$74.60

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Description:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1994. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 94CH34363. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
Item Price
A$74.60