Description:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1995. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 95CH35786. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '95), PROCEEDINGS OF IEEE INTERNATIONAL, 8-10 August 1995, Atlanta, Georgia by IEEE - 1995-01-01
by IEEE
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '95), PROCEEDINGS OF IEEE INTERNATIONAL, 8-10 August 1995, Atlanta, Georgia
by IEEE
- Used
- good
- Hardcover
The Institute of Electrical and Electronic Engineers, Inc, 1995-01-01. Hardcover. Good.
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Bookseller
Ergodebooks
(US)
- Format/Binding Hardcover
- Book Condition Used - Good
- Quantity Available 1
- Binding Hardcover
- ISBN 10 0780326229
- ISBN 13 9780780326224
- Publisher The Institute of Electrical and Electronic Engineers, Inc
- Date Published 1995-01-01
We have 1 copies available starting at A$66.20.
Stock Photo: Cover May Be Different
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '95), PROCEEDINGS OF IEEE INTERNATIONAL, 8-10 August 1995, Atlanta, Georgia.
by IEEE
- Used
- very good
- Hardcover
- first
- Condition
- Used - Very Good
- Jacket Condition
- No Jacket
- Edition
- 1st Edition.
- Binding
- Hardcover
- ISBN 13
- 9780780326224
- ISBN 10
- 0780326229
- Quantity Available
- 1
- Seller
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NEWARK, Ohio, United States
- Item Price
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A$66.20A$5.50 shipping to
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