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Encyclopedia Of Scanning Electron Microscopy

Encyclopedia Of Scanning Electron Microscopy

Encyclopedia Of Scanning Electron Microscopy
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Encyclopedia Of Scanning Electron Microscopy Hardback - 2015

by Lisa Page (Editor)

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New/New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!
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Details

  • Title Encyclopedia Of Scanning Electron Microscopy
  • Author Lisa Page (Editor)
  • Binding Hardback
  • Condition New
  • Pages 324
  • Volumes 1
  • Language ENG
  • Publisher NY Research Press
  • Publication date 2015-01-30
  • Illustrated Yes
  • Features Bibliography, Illustrated
  • Bookseller's Inventory # BIBNN-110596
  • ISBN 9781632381668 / 1632381664
  • Weight 1.33 lbs (0.60 kg)
  • Dimensions 9 x 6 x 0.75 in (22.86 x 15.24 x 1.91 cm)
  • Category Science
  • Library of Congress subjects Electron microscopes, Electron microscopy
  • Dewey Decimal Code 502.825
  • Quantity available 1

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Reader reviews for Encyclopedia Of Scanning Electron Microscopy

From the publisher

This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.
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