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Applied Scanning Probe Methods Ix  Characterization  (Hb 2008)

Applied Scanning Probe Methods Ix Characterization (Hb 2008)

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Applied Scanning Probe Methods Ix Characterization (Hb 2008)

by Bhushan B

  • Used
  • Very Good
Condition
Very Good
ISBN 10
3540740821
ISBN 13
9783540740827
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Details

Bookseller
indianaabooks US (US)
Bookseller's Inventory #
9783540740827
Title
Applied Scanning Probe Methods Ix Characterization (Hb 2008)
Author
Bhushan B
Book Condition
Used - Very Good
Quantity Available
1
Binding
Hardcover
ISBN 10
3540740821
ISBN 13
9783540740827
Publisher
Springer
This edition first published
2008

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indianaabooks

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About the Seller

indianaabooks

Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Biblio member since 2010
Indianapolis, Indiana
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