IEEE standard techniques for high-voltage testing

[New York]: Institute of Electrical and Electronics Engineers : Distributed in cooperation with Wiley-Interscience, 1978. Hardcover. Very Good/Fair+. 1978 Dark gray cloth boards with gilt titling on the spine and front, lightly rubbed at tips of spine. Binding is sound. Interior is unmarked. Four pages were bumped on long edge, 2 are wrinkled from that injury, one is wrinkled, the other has a 1-in. closed tear. Dustjacket is rubbed along edges and spine; rear upper edge has a 1/2-in. chip. Small quarto. Our photos depict actual book offered for sale. Books are carefully packaged by hand and shipped from our family-owned bookshop in the US. BOOK INFO: See photos for Table of Contents. Illustrated in B&W tables, graphs, charts and formulas. 'IEEE Std 4-1978 establishes standard methods of measurement of high-voltage and basic testing techniques for application to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents. It is a new, greatly enlarged revision of IEEE Std 4-1968, Techniques for Dielectric Tests. Section 1 is devoted to the definition of terms for general applications, and the presentation of general requirements regarding test objects and test procedures. Section 2 defines terms relating to the specific tests and describes methods for generation and measurement of test voltages and currents, for testing, and for the evaluation of test results. Applicable to devices and to complete systems used for the measurement of voltages and currents during dielectric testing. Section 3 provides definitions of terms related to measurements, states the requirements which the measuring systems shall meet, and describes some of the devices used. Section 4, an application guide for measuring devices, provides information on measuring systems and devices used for the measurement of high-voltage or currents during the performance of dielectric tests, and describes measuring and calibration procedures. Section 5 addresses the use of the sphere gap for the measurement of peak value and describes the geometry of the standard sphere gap, defines its connections, outlines its use, and provides sphere gap disruptive-discharge voltage data, including the influence of atmospheric data, the sources of these data, and the tolerances or the accuracy. This Sixth Edition has changed the standard reference temperature from 25C to 20C to agree with IEC practice, and includes specifications for wet tests and switching impulse tests, a revised wet test procedure, contamination testing procedures, and an application guide for measuring devices.' (-from the endflap). At head of title: IEEE std 4-1978 (revision of IEEE std 4-1969) 125 p. : ill. ; 27 cm.