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Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic Testing)

Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic Testing)

Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic
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Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic Testing)

by Ahmed, Nisar

  • Used
  • Hardcover
Condition
Like New
ISBN 10
0521801737
ISBN 13
9780521801737
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Port Tobacco, Maryland, United States
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About This Item

Springer, 2007-12-20. Hardcover. Like New. 0.9000 9.3000 6.3000. Hardcover. No noticeable cover wear. Has remainder mark. Clean unmarked text. Tight binding.

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Details

Bookseller
Dewey Books PTMD US (US)
Bookseller's Inventory #
mon0000013066
Title
Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic Testing)
Author
Ahmed, Nisar
Format/Binding
Hardcover
Book Condition
New Like New
Quantity Available
1
ISBN 10
0521801737
ISBN 13
9780521801737
Publisher
Springer
Place of Publication
Cambridge
Date Published
2007-12-20
Bookseller catalogs
Book;
Size
0.9000 9.3000 6.3000

Terms of Sale

Dewey Books PTMD

30 day return guarantee, with full refund including original shipping costs for up to 30 days after delivery if an item arrives incorrectly described or damaged.

About the Seller

Dewey Books PTMD

Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Biblio member since 2021
Port Tobacco, Maryland

About Dewey Books PTMD

Dewey Books PTMD sells new and used books and ships via USPS Monday thru Friday, excluding holidays.

Glossary

Some terminology that may be used in this description includes:

New
A new book is a book previously not circulated to a buyer. Although a new book is typically free of any faults or defects, "new"...
Remainder Mark
Usually an ink marking of some sort which indicates that the book was designated a remainder. In most cases, it can be found on...
Tight
Used to mean that the binding of a book has not been overly loosened by frequent use.
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