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Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)

Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)

Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)
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Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)

by Strong

  • Used
  • Very Good
Condition
Very Good
ISBN 10
0471731722
ISBN 13
9780471731726
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Very Good.

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Details

Bookseller
indianaabooks US (US)
Bookseller's Inventory #
9780471731726
Title
Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)
Author
Strong
Book Condition
Used - Very Good
Quantity Available
1
Binding
Hardcover
ISBN 10
0471731722
ISBN 13
9780471731726
Publisher
IEEE Press | Wiley
Place of Publication
Piscataway, NJ
This edition first published
2009
LCCN
2011377262

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indianaabooks

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About the Seller

indianaabooks

Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Biblio member since 2010
Indianapolis, Indiana
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