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Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)
by Strong
- Used
- Very Good
- Condition
- Very Good
- ISBN 10
- 0471731722
- ISBN 13
- 9780471731726
- Seller
-
Indianapolis, Indiana, United States
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Details
- Bookseller
- indianaabooks (US)
- Bookseller's Inventory #
- 9780471731726
- Title
- Reliability Wearout Mechanisms In Advanced Cmos Technologies (Hb 2009)
- Author
- Strong
- Book Condition
- Used - Very Good
- Quantity Available
- 1
- Binding
- Hardcover
- ISBN 10
- 0471731722
- ISBN 13
- 9780471731726
- Publisher
- IEEE Press | Wiley
- Place of Publication
- Piscataway, NJ
- This edition first published
- 2009
- LCCN
- 2011377262
Terms of Sale
indianaabooks
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