Skip to content

Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and
Stock Photo: Cover May Be Different

Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization: Volume 46 Hardcover - 1997 - 1st Edition

by R. K. Willardson (Editor); Eicke R. Weber (Editor); Constantinos Christofides (Volume Editor)


From the publisher

Defects in ion-implanted semiconductors are important and will likely gain increased importance as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects whose origin and annealing characteristics will need to be addressed. Publications in this field mainly focus on the effects of ion implantation on the material and the modification in the implanted layer after high temperature annealing. The editors of this volume and Volume 45 focus on the physics of the annealing kinetics of the damaged layer. An overview of characterization tehniques and a critical comparison of the information on annealing kinetics is also presented.

First line

These days a renaissance of the technique of ellipsometry can be witnessed.

Details

  • Title Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization: Volume 46
  • Author R. K. Willardson (Editor); Eicke R. Weber (Editor); Constantinos Christofides (Volume Editor)
  • Binding Hardcover
  • Edition number 1st
  • Edition 1
  • Pages 316
  • Volumes 1
  • Language ENG
  • Publisher Academic Press, New York
  • Date 1997-05-22
  • ISBN 9780127521466 / 0127521461
  • Weight 1.36 lbs (0.62 kg)
  • Dimensions 9 x 6 x 0.75 in (22.86 x 15.24 x 1.91 cm)
  • Dewey Decimal Code 621.381
Back to Top

More Copies for Sale

Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal...
Stock Photo: Cover May Be Different

Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization

by Willardson

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9780127521466 / 0127521461
Quantity Available
464
Seller
Uxbridge, Greater London, United Kingdom
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
A$387.08
A$15.55 shipping to USA

Show Details

Description:
Hard Cover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization.
Item Price
A$387.08
A$15.55 shipping to USA
Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal...
Stock Photo: Cover May Be Different

Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization (Volume 46) (Semiconductors and Semimetals, Volume 46)

by Christofides, Constantinos [Editor]; Ghibaudo, Gerard [Editor]; Willardson, Robert K. [Series Editor]; Weber, Eicke R. [Series Editor];

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9780127521466 / 0127521461
Quantity Available
5
Seller
campbelltown, Florida, United States
Seller rating:
This seller has earned a 1 of 5 Stars rating from Biblio customers.
Item Price
A$584.99
A$23.28 shipping to USA

Show Details

Description:
Academic Press. Hardcover. New. 8x6x0.
Item Price
A$584.99
A$23.28 shipping to USA