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Introduction to Advanced System-On-Chip Test Design and Optimization
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Introduction to Advanced System-On-Chip Test Design and Optimization Hardcover - 2005 - 2005th Edition

by Erik Larsson


From the publisher

SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. It first introduces readers to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. Then it discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The final part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process. Intended for graduate students and PhD-students working in the test field, the manual also aids researchers and professors who would like to get into the area of SOC testing.

Details

  • Title Introduction to Advanced System-On-Chip Test Design and Optimization
  • Author Erik Larsson
  • Binding Hardcover
  • Edition number 2005th
  • Edition 2005
  • Pages 388
  • Volumes 1
  • Language ENG
  • Publisher Springer, Dordrecht
  • Date 2005-11-07
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index, Table of Contents
  • ISBN 9781402032073 / 1402032072
  • Weight 2.41 lbs (1.09 kg)
  • Dimensions 9.8 x 6.6 x 0.87 in (24.89 x 16.76 x 2.21 cm)
  • Library of Congress subjects Integrated circuits - Design and construction, Systems on a chip - Testing
  • Dewey Decimal Code 621.381

About the author

Dr. Erik Larsson is an assistant professor at Linkpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies
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INTRODUCTION TO ADVANCED SYSTEM-ON-CHIP TEST DESIGN AND OPTIMIZATION
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INTRODUCTION TO ADVANCED SYSTEM-ON-CHIP TEST DESIGN AND OPTIMIZATION

by Larsson, Erik

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Netherlands: Springer-Verlag, 2005. (NETH) Presumed 1st edition Ownership stamp to top edge of pages, small ownerhsip label to the back of the cover, no other markings, Near Fine; no dust jacket as published. Hardcover, 388pp, index, diagrams. This book gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and… Read More
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Introduction to Advanced System-on-Chip Test Design and Optimization

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