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Thermal Testing of Integrated Circuits Hardcover - 2002
by J. Altet; Antonio Rubio
Details
- Title Thermal Testing of Integrated Circuits
- Author J. Altet; Antonio Rubio
- Binding Hardcover
- Edition 1st
- Pages 204
- Volumes 1
- Language ENG
- Publisher Springer
- Date 2002-06-30
- Illustrated Yes
- ISBN 9781402070761 / 1402070764
- Weight 1.19 lbs (0.54 kg)
- Dimensions 9.96 x 6.32 x 0.57 in (25.30 x 16.05 x 1.45 cm)
- Library of Congress subjects Integrated circuits - Testing, Temperature measurements
- Library of Congress Catalog Number 2002030050
- Dewey Decimal Code 621.381
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THERMAL TESTING OF INTEGRATED CIRCUITS
by J. ALTET, ANTONIO MARTINEZ-RUBIO,
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Thermal Testing of Integrated Circuits
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Thermal Testing of Integrated Circuits
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Hardback. New. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
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Thermal Testing of Integrated Circuits
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Thermal Testing of Integrated Circuits
by Altet, J.; Rubio, Antonio
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