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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup
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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments Hardback - 2011 - 2012th Edition

by Xie, Hui/ Onal, Cagdas/ Regnier, Stephane/ Sitti, Metin

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Springer Verlag, 2011. Hardcover. New. 2011 edition. 360 pages. 9.00x6.25x0.75 inches.
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Details

  • Title Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments
  • Author Xie, Hui/ Onal, Cagdas/ Regnier, Stephane/ Sitti, Metin
  • Binding Hardback
  • Edition number 2012th
  • Edition 2012
  • Condition New
  • Pages 342
  • Language ENG
  • Publisher Springer Verlag
  • Publication date 2011
  • Bookseller's Inventory # x-3642203280
  • ISBN 9783642203282
  • Themes
    • Aspects (Academic): Nanotechnology
  • Quantity available 2

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Reader reviews for Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

From the rear cover

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

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