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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization) (Volume 5) Hardback - 1998 - 1999th Edition
by Czanderna, AW (Ed)
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- Hardback
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Details
- Title Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization) (Volume 5)
- Author Czanderna, AW (Ed)
- Binding Hardback
- Edition number 1999th
- Edition 1999
- Pages 430
- Volumes 1
- Language ENG
- Publisher Plenum Press
- Publication date 1998
- Illustrated Yes
- Features Bibliography, Illustrated, Index
- Bookseller's Inventory # 5974494
- ISBN 9780306458965 / 0306458969
- Weight 1.79 lbs (0.81 kg)
- Dimensions 9.21 x 6.14 x 1 in (23.39 x 15.60 x 2.54 cm)
- Category Technology & Industrial Arts
- Library of Congress subjects Materials - Effect of radiation on, Surfaces (Technology) - Analysis
- Library of Congress Catalogue Number 98041250
- Dewey Decimal Code 620.44
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