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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Hardback - - 1999th Edition
by Alvin W. Czanderna (Editor); Theodore E. Madey (Editor); Cedric J. Powell (Editor)
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- Hardback
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A$5.79
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Details
- Title Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
- Author Alvin W. Czanderna (Editor); Theodore E. Madey (Editor); Cedric J. Powell (Editor)
- Binding Hardback
- Edition number 1999th
- Edition 1999
- Condition Used
- Pages 430
- Volumes 1
- Language ENG
- Publisher Springer
- Publication date pp. 456
- Illustrated Yes
- Features Bibliography, Illustrated, Index
- Bookseller's Inventory # 6533143
- ISBN 9780306458965 / 0306458969
- Weight 1.79 lbs (0.81 kg)
- Dimensions 9.21 x 6.14 x 1 in (23.39 x 15.60 x 2.54 cm)
- Category Technology & Industrial Arts
- Library of Congress subjects Materials - Effect of radiation on, Surfaces (Technology) - Analysis
- Library of Congress Catalogue Number 98041250
- Dewey Decimal Code 620.44
- Quantity available 1
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