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Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)

Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)

Characterization and Metrology for ULSI Technology 2005 (AIP Conference
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Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)

by David G. Seiler (Editor), Alain C. Diebold (Editor), Robert McDonald (Editor), Caroline R. Ayre (Editor), Rajinder P. Khosla (Editor), Stefan Zollner (Editor), Erik M. Secula (Editor)

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  • Hardcover
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Used:Good
ISBN 10
0735402779
ISBN 13
9780735402775
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About This Item

American Inst. of Physics, 2005-09-29. 1. Hardcover. Used:Good.

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Bookseller
Ergodebooks US (US)
Bookseller's Inventory #
DADAX0735402779
Title
Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)
Author
David G. Seiler (Editor), Alain C. Diebold (Editor), Robert McDonald (Editor), Caroline R. Ayre (Editor), Rajinder P. Khosla (Editor), Stefan Zollner (Editor), Erik M. Secula (Editor)
Format/Binding
Hardcover
Book Condition
Used:Good
Quantity Available
1
Edition
1
ISBN 10
0735402779
ISBN 13
9780735402775
Publisher
American Inst. of Physics
Date Published
2005-09-29

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Ergodebooks

Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
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HOUSTON, Texas

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