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American Inst. of Physics, 2005-09-29. Hardcover. Used: Good. Excellent customer service. Prompt Customer Service.
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Characterization and Metrology for ULSI Technology 2005 Hardcover - 2005 - 1st Edition
by D. G. Seiler; David G. Seiler (Editor); Alain C. Diebold (Editor)
Details
- Title Characterization and Metrology for ULSI Technology 2005
- Author D. G. Seiler; David G. Seiler (Editor); Alain C. Diebold (Editor)
- Binding Hardcover
- Edition number 1st
- Edition 1
- Pages 667
- Volumes 1
- Language ENG
- Publisher Springer
- Date September 29, 2005
- Illustrated Yes
- ISBN 9780735402775 / 0735402779
- Weight 4.17 lbs (1.89 kg)
- Dimensions 10.94 x 8.43 x 1.71 in (27.79 x 21.41 x 4.34 cm)
- Library of Congress subjects Integrated circuits - Ultra large scale
- Library of Congress Catalog Number 2005931820
- Dewey Decimal Code 621.395
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Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)
by Editor-David G. Seiler; Editor-Alain C. Diebold; Editor-Robert McDonald; Editor-Caroline R. Ayre; Editor-Rajinder P. Khosla; Editor-Stefan Zollner; Editor-Erik M. Secula
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- Hardcover
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- Used: Good
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780735402775 / 0735402779
- Quantity Available
- 1
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HOUSTON, Texas, United States
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A$33.22FREE shipping to USA
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Stock Photo: Cover May Be Different
Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)
by David G. Seiler (Editor), Alain C. Diebold (Editor), Robert McDonald (Editor), Caroline R. Ayre (Editor), Rajinder P. Khosla (Editor), Stefan Zollner (Editor), Erik M. Secula (Editor)
- Used
- Hardcover
- Condition
- Used:Good
- Edition
- 1
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780735402775 / 0735402779
- Quantity Available
- 1
- Seller
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HOUSTON, Texas, United States
- Item Price
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A$33.22FREE shipping to USA
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American Inst. of Physics, 2005-09-29. 1. Hardcover. Used:Good.
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A$33.22
FREE shipping to USA
Stock Photo: Cover May Be Different
CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2005
by D.G.; DIEBOLD, A.C.; MCDONALD, R.; AYRE, C.R.; KHOSLA, R.P.; ZOLLNER, S.; SECULA, E.M,
- Used
- Hardcover
- first
- Condition
- UsedLikeNew
- Edition
- 1st
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780735402775 / 0735402779
- Quantity Available
- 1
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New Delhi, India
- Item Price
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A$130.15A$15.49 shipping to USA
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Description:
AIP, 2005. 1st. Hardcover. UsedLikeNew/UsedLikeNew.
Item Price
A$130.15
A$15.49
shipping to USA