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Electron Diffraction in the Transmission Electron Microscope (Microscopy Handbooks (BIOS), 49)

Electron Diffraction in the Transmission Electron Microscope (Microscopy Handbooks (BIOS), 49)

Electron Diffraction in the Transmission Electron Microscope (Microscopy
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Electron Diffraction in the Transmission Electron Microscope (Microscopy Handbooks (BIOS), 49) Paperback - 2001 - 1st Edition

by Champness, P.E. E

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Garland Science, 10/12/2001 12:00:01. paperback. Very Good. 0.4000 9.1000 6.0000. clean cover; clean pages; good spine
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Details

  • Title Electron Diffraction in the Transmission Electron Microscope (Microscopy Handbooks (BIOS), 49)
  • Author Champness, P.E. E
  • Binding Paperback
  • Edition number 1st
  • Edition 1
  • Condition Used - Very good
  • Pages 186
  • Volumes 1
  • Language ENG
  • Publisher Garland Science
  • Publication date 10/12/2001 12:00:01
  • Features Maps
  • Bookseller's Inventory # ama4209
  • ISBN 9781859961476 / 1859961479
  • Weight 0.8 lbs (0.36 kg)
  • Dimensions 9.34 x 6.22 x 0.41 in (23.72 x 15.80 x 1.04 cm)
  • Size 0.4000 9.1000 6.0000
  • Category Science
  • Dewey Decimal Code 502.825
  • Quantity available 1

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Reader reviews for Electron Diffraction in the Transmission Electron Microscope (Microscopy Handbooks (BIOS), 49)

From the publisher

This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached.

About the author

Pamela Champness graduated from Cambridge University in Natural Sciences (Mineralogy) in 1964 and was awarded a PhD in Mineralogy from Cambridge in 1969. She has recently retired as Reader in Crystallography at the Department of Earth Sciences, University of Manchester and is now an Honorary Research Fellow. Her main research interests are in the applications of transmission electron microscopy to phase transformations in minerals
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