Stock photo: cover may vary
Electron Microprobe Analysis and Scanning Electron Microscopy In Geology Paperback - 2010 - 2nd Edition
by Reed, S J B,
- New
A$103.21
A$5.66
Delivery within USA
Standard delivery: 2 to 14 days
More delivery options
Standard delivery: 2 to 14 days
Ships from GreatBookPrices (Maryland, United States)
Details
- Title Electron Microprobe Analysis and Scanning Electron Microscopy In Geology
- Author Reed, S J B,
- Binding Paperback
- Edition number 2nd
- Edition 2
- Condition New
- Pages 212
- Volumes 1
- Language ENG
- Publisher Cambridge University Press
- Publication date 2010-06-10
- Bookseller's Inventory # 9498126-n
- ISBN 9780521142304 / 052114230X
- Weight 0.76 lbs (0.34 kg)
- Dimensions 9.61 x 6.69 x 0.45 in (24.41 x 16.99 x 1.14 cm)
-
Themes
- Aspects (Academic): Science/Technology Aspects
- Category Science
- Dewey Decimal Code 552.8
- Quantity available 5
About GreatBookPrices Maryland, United States
Biblio member since 2024
Since 1991, we have worked every day to serve our customers with state-of-the-art technology and world class service. We are dedicated to providing customers around the world with the widest selection of books, DVDs, and CDs at the absolute lowest price.
Reader reviews for Electron Microprobe Analysis and Scanning Electron Microscopy In Geology
Write a review for this book
Important Terms and Guidelines
- Please focus on the book’s content and context. Also, add any personal comments as to how you enjoyed the book. Substantiate your likes and dislikes. You may make comparisons to other books.
- Reviews must be at least 140 characters in length.
- Please do not reveal critical plot elements.
- This is not a help line. Contact customer support if you need help.
Your review must not include:
- Obscenities, discriminatory language, or other insulting language not suitable for public domain
- Advertisements, “spam” content, or references to other products, offers or websites.
- Email addresses, URLs, phone numbers, physical addresses or other contact information.
- Overly critical comments about other reviews or reviewers
- Time-sensitive material (i.e. promotional tours, seminars, lectures, etc.)
- Availability, price, or alternative ordering/shipping information
