BIBLIO is the largest independent book marketplace in the world, with over 100 million books.

Skip to content

Electron Microscopy and Analysis, Third Edition

Electron Microscopy and Analysis, Third Edition

Electron Microscopy and Analysis, Third Edition
Stock photo: cover may vary

Electron Microscopy and Analysis, Third Edition Paperback - 2000

by Peter J Goodhew, John Humphreys, Richard Beanland,

Add to wish list
  • New
New

Description

new.
Ask the seller a question Add to wish list
A$168.83
A$5.78 Delivery within USA
Standard delivery: 2 to 14 days
More delivery options
Ships from GreatBookPrices (Maryland, United States)

Details

About GreatBookPrices Maryland, United States

Biblio member since 2024

Since 1991, we have worked every day to serve our customers with state-of-the-art technology and world class service. We are dedicated to providing customers around the world with the widest selection of books, DVDs, and CDs at the absolute lowest price.

Terms of Sale: 30 day return guarantee, with full refund including original shipping costs for up to 30 days after delivery if an item arrives misdescribed or damaged.

Browse books from GreatBookPrices

Reader reviews for Electron Microscopy and Analysis, Third Edition

From the publisher

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

First line

A microscope is an optical system which transforms an 'object' into an 'image'.

Media reviews

Citations

  • Scitech Book News, 06/01/2001, Page 68

About the author

Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.
tracking-