BIBLIO is the largest independent book marketplace in the world, with over 100 million books.

Skip to content

Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM

Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM

Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM
Stock photo: cover may vary

Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM Hardback - 2024

by Tanaka, Nobuo

Add to wish list
  • Used
  • Hardback
Used: See the description

Description

Springer, 2024. 414 pp., hardcover, new. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
Ask the seller a question Add to wish list
A$148.13
A$6.50 Delivery within USA
Standard delivery: 7 to 14 days
More delivery options
Ships from Zubal Books (Ohio, United States)
Biblio Top Seller
The BIBLIO Guarantee

Details

About Zubal Books Ohio, United States

Specialising in: Anthropology, Art, Engineering, History, Occult, Philosophy, Physics, Science
Biblio member since 2005

Zubal Books has been the leader in scholarly and rare books since 1961. We purchase individual books as well as entire libraries.

Terms of Sale: All prices are NET. Returns accepted within 5 days of receiving book.

Browse books from Zubal Books

Reader reviews for Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM

Write a review for this book

There are no reviews for this book yet. Be the first to write a review!

Your review will be anonymous unless you login or create an account first.

Overall rating
Remember: You’re rating the book as a work, not the seller or the condition of the specific copy you purchased!

Important Terms and Guidelines

  • Please focus on the book’s content and context. Also, add any personal comments as to how you enjoyed the book. Substantiate your likes and dislikes. You may make comparisons to other books.
  • Reviews must be at least 140 characters in length.
  • Please do not reveal critical plot elements.
  • This is not a help line. Contact customer support if you need help.
Your review must not include:
  • Obscenities, discriminatory language, or other insulting language not suitable for public domain
  • Advertisements, “spam” content, or references to other products, offers or websites.
  • Email addresses, URLs, phone numbers, physical addresses or other contact information.
  • Overly critical comments about other reviews or reviewers
  • Time-sensitive material (i.e. promotional tours, seminars, lectures, etc.)
  • Availability, price, or alternative ordering/shipping information

From the rear cover

In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today's graduate students and professionals just starting their careers.

About the author

Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC) and Nagoya Industrial Science Research Institute (NISRI). He received a Ph.D. degree from Applied Physics Department of Nagoya University in 1978 and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004 and IMaSS in 2015. He was the director of the institute from 2012 to 2015. He was also the president of Japanese Microscopy Society (JSM) from 2015 to 2017.

Please wait a moment while we load the requested page.

tracking-