BIBLIO is the largest independent book marketplace in the world, with over 100 million books.

Skip to content

Encyclopedia of Computer Science and Technology: Volume 13 - Reliability Theory to USSR: Computing in (Computer Science and Technology Encyclopedia)

Encyclopedia of Computer Science and Technology: Volume 13 - Reliability Theory to USSR: Computing in (Computer Science and Technology Encyclopedia)

Encyclopedia of Computer Science and Technology: Volume 13 - Reliability Theory
Stock photo: cover may vary

Encyclopedia of Computer Science and Technology: Volume 13 - Reliability Theory to USSR: Computing in (Computer Science and Technology Encyclopedia) Hardback - 1979 - 1st Edition

by Belzer, Jack

Add to wish list
  • New
  • Hardback
  • first
New

Description

CRC Press, 1979-10-01. 1. hardcover. New. 7.50x1.25x10.75. Buy with confidence. Excellent Customer Service & Return policy.
Ask the seller a question Add to wish list
A$342.92
Free Delivery within USA
Standard delivery: 5 to 10 days
More delivery options
Dropship order
Ships from Ergodebooks (Texas, United States)

Details

About Ergodebooks Texas, United States

Biblio member since 2005

Our goal is to provide best customer service and good condition books for the lowest possible price. We are always honest about condition of book. We list book only by ISBN # and hence exact book is guaranteed.

Terms of Sale:

We have 30 day return policy.

Browse books from Ergodebooks

Reader reviews for Encyclopedia of Computer Science and Technology: Volume 13 - Reliability Theory to USSR: Computing in (Computer Science and Technology Encyclopedia)

From the publisher

This comprehensive reference work provides immediate, fingertip access to state-of-the-art technology in nearly 700 self-contained articles written by over 900 international authorities. Each article in the Encyclopedia features current developments and trends in computers, software, vendors, and applications...extensive bibliographies of leading figures in the field, such as Samuel Alexander, John von Neumann, and Norbert Wiener...and in-depth analysis of future directions.

First line

The reliability of a device (component, system, etc.) is defined [4] to be the probability of performing its purpose adequately for the period of time intended under the operating conditions encountered.

About the author

Belzer\, Jack; Holzman\, Albert G.; Kent\, Allen
tracking-