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High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography Paperback / softback - 2019

by D. Keith Bowen

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Ships from The Saint Bookstore (Merseyside, United Kingdom)

Details

  • Title High Resolution X-Ray Diffractometry And Topography
  • Author D. Keith Bowen
  • Binding Paperback
  • Condition New
  • Pages 264
  • Volumes 1
  • Language ENG
  • Publisher CRC Press
  • Publication date 2019-10-10
  • Features Maps
  • Bookseller's Inventory # A9780367400637
  • ISBN 9780367400637 / 0367400634
  • Weight 0.95 lbs (0.43 kg)
  • Dimensions 9.5 x 6.8 x 0.7 in (24.13 x 17.27 x 1.78 cm)
  • Category Science
  • Dewey Decimal Code 548.83
  • Quantity available 1

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Reader reviews for High Resolution X-Ray Diffractometry And Topography

From the publisher

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
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