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Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements

Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements

Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements Paperback / softback - 2012

by Eric A Buschelman

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Details

  • Title Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements
  • Author Eric A Buschelman
  • Binding Paperback
  • Condition New
  • Pages 102
  • Volumes 1
  • Language ENG
  • Publisher Biblioscholar
  • Publication date 2012-10-09
  • Bookseller's Inventory # B9781249595496
  • ISBN 9781249595496 / 1249595495
  • Weight 0.43 lbs (0.20 kg)
  • Dimensions 9.69 x 7.44 x 0.21 in (24.61 x 18.90 x 0.53 cm)
  • Category Education / Teaching
  • Quantity available 10

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Reader reviews for Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements

From the publisher

This research presents a method using modal analysis by which electromagnetic characterization of materials in a partially filled rectangular waveguide, having a single top air gap, can be accurately performed. Thermal expansion of waveguides commonly occurs during high-temperature measurements, resulting in air gaps between the sample and waveguide walls. Higher order modes are excited by the discontinuous geometry, which are not accounted for in most closed form extraction algorithms.

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