Microeconometrics Paperback - 2009

ALBERTO ABADIE Harvard Kennedy School, USA JOSHUA D. ANGRIST Massachusetts Institute of Technology, USA BADI H. BALTAGI University of Arizona, USA MOSHE BUCHINSKY University of California Los Angeles, USA COLIN A. CAMERON University of California Davis, USA TIMOTHY G. CONLEY University of Chicago, USA JOHN DINARDO University of Michigan, USA JEFF DOMINITZ Carnegie Mellon University, USA DAVID DRAPER University of California Santa Cruz, USA JEAN-MARIE DUFOUR McGill University, USA ANDREW GELMAN Columbia University, USA JINYONG HAHN University of California Los Angeles, USA VASSILIS A. HAJIVASILIOU London School of Economics, UK JERRY A. HAUSMAN Massachusetts Institute of Technology, USA JAMES J. HECKMAN The University of Chicago, USA KEISUKE HIRANO University of Arizona, USA CHENG HSIAO University of Southern California, USA GUIDO W. IMBENS University of California Berkeley, USA YANNIS IOANNIDES Tufts University, USA EKATERINI KYRIAZIDOU University of California Los Angeles, USA EDWARD E. LEAMER University of California Los Angeles, USA BRUCE G. LINDSAY Penn State University, USA OLIVER B. LINTON London School of Economics, UK JOHN A. LIST University of Chicago, USA THIERRY MAGNAC University of Toulouse 1, France CHARLES F. MANSKI Northwestern University, USA ROSA L. MATZKIN University of California Los Angeles, USA SALVADOR NAVARRO University of Madison Wisconsin, USA JAMES L. POWELL University of California Berkeley, USA DAVID REILEY University of Arizona, USA ERIC RENAULT University of North Carolina Chapel Hill, USA JEAN-MARC ROBIN University of Paris 1, France DONALD B. RUBIN Harvard University, USA ROBERT P. SHERMAN California Institute of Technology, USA MICHAEL STEWART University of Sydney, Australia CHRISTOPHER TABER The University of Wisconsin Madison, USA ELIE TAMER Northwestern University, USA PETRA E. TODD University of Pennsylvania, USA GERARD J. VAN DEN BERG University of Amsterdam, The Netherlands WILBERT VAN DER KLAAUW Federal Reserve Bank of New York, USA ARTHUR VAN SOEST Tilburg University, The Netherlands TIEMEN M. WOUTERSEN Johns Hopkins University, USA