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Pattern Classification

Pattern Classification

Pattern Classification
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Pattern Classification Hardback - 2000

by Richard O. Duda; Peter E. Hart; David G. Stork

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Wiley-Interscience. Used - Like New. hardcover. Page block firm and clean, binding unblemished, boards straight, without markings of any kind. Supporting Bay Area Friends of the Library since 2010. Well packaged and promptly shipped.
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Details

  • Title Pattern Classification
  • Author Richard O. Duda; Peter E. Hart; David G. Stork
  • Binding Hardback
  • Edition INTERNATIONAL ED
  • Condition New
  • Pages 688
  • Volumes 1
  • Language ENG
  • Publisher Wiley-Interscience, U.S.A.
  • Publication date 2000-11
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • Bookseller's Inventory # BAY17-00178
  • ISBN 9780471056690 / 0471056693
  • Weight 2.75 lbs (1.25 kg)
  • Dimensions 10.31 x 7.31 x 1.3 in (26.19 x 18.57 x 3.30 cm)
  • Category Computers - General Information
  • Library of Congress subjects Statistical decision, Pattern recognition systems
  • Library of Congress Catalogue Number 99029981
  • Dewey Decimal Code 006.4
  • Quantity available 1

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Reader reviews for Pattern Classification

From the publisher

Unter Musterklassifikation versteht man die Zuordnung eines physikalischen Objektes zu einer von mehreren vordefinierten Kategorien. Auf dieser Grundlage knnen Computer Muster erkennen. Das Interesse an diesem Forschungsgebiet hat in den letzten Jahren, besonders im Zuge der Weiterentwicklung neuronaler Netze, stark zugenommen. Die umfassend berarbeitete, erweiterte und jetzt zweifarbig gestaltete Neuauflage beschreibt alle wesentlichen Aspekte der Mustererkennung systematisch und verstndlich. Mit Lsungsheft! (01/00)

From the rear cover

From the reviews of the First Edition . . .

"The first edition of this book, published 30 years ago by Duda and Hart, has been a defining book for the field of Pattern Recognition. Stork has done a superb job of updating the book. He has undertaken a monumental task of sifting through 30 years of material in a rapidly growing field and presented another snapshot of the field, determining what will be of importance for the next 30 years and incorporating it into this second edition. The style is easy to read as in the original book and the statistical, mathematical material comes alive with many new illustrations. The end result is harmonious, leading the reader through many new topics..." --Sargur N. Srihari, PhD, Director, Center for Excellence in Document Analysis and Recognition, Distinguished Professor, Department of Computer Science and Engineering, SUNY at Buffalo

Practitioners developing or investigating pattern recognition systems in such diverse application areas as speech recognition, optical character recognition, image processing, or signal analysis, often face the difficult task of having to decide among a bewildering array of available techniques. This unique text/professional reference provides the information you need to choose the most appropriate method for a given class of problems, presenting an in-depth, systematic account of the major topics in pattern recognition today. A new edition of a classic work that helped define the field for over a quarter century, this practical book updates and expands the original work, focusing on pattern classification and the immense progress it has experienced in recent years. Special features include:
* Clear explanations of both classical and new methods, including neural networks, stochastic methods, genetic algorithms, and theory of learning
* Over 350 high-quality, two-color illustrations highlighting various concepts
* Numerous worked examples
* Pseudocode for pattern recognition algorithms
* Expanded problems, keyed specifically to the text
* Complete exercises, linked to the text
* Algorithms to explain specific pattern-recognition and learning techniques
* Historical remarks and important references at the end of chapters
* Appendices covering the necessary mathematical background

Media reviews

Citations

  • Scitech Book News, 06/01/2001, Page 19

About the author

RICHARD O. DUDA, PhD, is Professor in the Electrical Engineering Department at San Jose State University, San Jose, California.

PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California.

DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc.

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