BIBLIO is the largest independent book marketplace in the world, with over 100 million books.

Skip to content

Physical and Technical Problems of SOI Structures and Devices (Nato Science Partnership Subseries: 3 (closed))

Physical and Technical Problems of SOI Structures and Devices (Nato Science Partnership Subseries: 3 (closed))

Physical and Technical Problems of SOI Structures and Devices (Nato Science
Stock photo: cover may vary

Physical and Technical Problems of SOI Structures and Devices (Nato Science Partnership Subseries: 3 (closed)) Paperback - 2012

by Nazarov, Alexei N. (Editor) / Lysenko, Vladimir S. (Editor) / Colinge, J.-P. (Editor)

Add to wish list
  • New
  • Paperback
New

Description

Springer, 2012. Paperback. New. reprint edition. 300 pages. 9.40x6.20x0.80 inches.
Ask the seller a question Add to wish list
A$130.30
A$29.09 Delivery to USA
Standard delivery: 7 to 14 days
More delivery options
Ships from Revaluation Books (Devon, United Kingdom)

Details

  • Title Physical and Technical Problems of SOI Structures and Devices (Nato Science Partnership Subseries: 3 (closed))
  • Author Nazarov, Alexei N. (Editor) / Lysenko, Vladimir S. (Editor) / Colinge, J.-P. (Editor)
  • Binding Paperback
  • Condition New
  • Pages 290
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date 2012
  • Bookseller's Inventory # x-9401040524
  • ISBN 9789401040525 / 9401040524
  • Weight 0.94 lbs (0.43 kg)
  • Dimensions 9.21 x 6.14 x 0.64 in (23.39 x 15.60 x 1.63 cm)
  • Category Technology & Industrial Arts
  • Dewey Decimal Code 621.381
  • Quantity available 2

About Revaluation Books Devon, United Kingdom

Biblio member since 2020

General bookseller of both fiction and non-fiction.

Terms of Sale: 30 day return guarantee, with full refund including original shipping costs for up to 30 days after delivery if an item arrives misdescribed or damaged.

Browse books from Revaluation Books

Reader reviews for Physical and Technical Problems of SOI Structures and Devices (Nato Science Partnership Subseries: 3 (closed))

From the publisher

In Physical and Technical Problems of SOI Structures and Devices, specialists in silicon-on-insulator technology from both East and West meet for the first time, giving the reader the chance to become acquainted with work from the former Soviet Union, hitherto only available in Russian and barely available to western scientists. Keynote lectures and state-of-the-art presentations give a wide-ranging panorama of the challenges posed by SOI materials and devices, material fabrication techniques, characterisation, device and circuit issues.
tracking-