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Process Variations and Probabilistic Integrated Circuit Design

Process Variations and Probabilistic Integrated Circuit Design

Process Variations and Probabilistic Integrated Circuit Design
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Process Variations and Probabilistic Integrated Circuit Design Hardback - 2011 - 20th Edition

by Dietrich, Manfred (Editor)

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Description

Springer Verlag, 2011. Hardcover. New. 2012 edition. 265 pages. 9.00x6.25x0.75 inches.
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Details

  • Title Process Variations and Probabilistic Integrated Circuit Design
  • Author Dietrich, Manfred (Editor)
  • Binding Hardback
  • Edition number 20th
  • Edition 20
  • Condition New
  • Pages 252
  • Volumes 1
  • Language ENG
  • Publisher Springer Verlag
  • Publication date 2011
  • Features Bibliography, Index
  • Bookseller's Inventory # x-144196620X
  • ISBN 9781441966209 / 144196620X
  • Weight 1 lbs (0.45 kg)
  • Dimensions 9.2 x 6.1 x 0.7 in (23.37 x 15.49 x 1.78 cm)
  • Themes
    • Aspects (Academic): Science/Technology Aspects
  • Category Technology & Industrial Arts
  • Library of Congress subjects Integrated circuits - Design and construction, Integrated circuits - Computer-aided design
  • Library of Congress Catalogue Number 2011940313
  • Dewey Decimal Code 621.381
  • Quantity available 2

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Reader reviews for Process Variations and Probabilistic Integrated Circuit Design

From the publisher

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

From the rear cover

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.

This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

  • Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
  • Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
  • Describes critical effects of process variation using simple examples that can be reproduced by the reader.


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