Process Variations and Probabilistic Integrated Circuit Design Hardback - 2011 - 20th Edition
by Manfred Dietrich (Editor); Joachim Haase (Editor)
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- Hardback
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Details
- Title Process Variations and Probabilistic Integrated Circuit Design
- Author Manfred Dietrich (Editor); Joachim Haase (Editor)
- Binding Hardback
- Edition number 20th
- Edition 20
- Condition New
- Pages 252
- Volumes 1
- Language ENG
- Publisher Springer
- Publication date 2011-11-19
- Features Bibliography, Index
- Bookseller's Inventory # ria9781441966209_inp
- ISBN 9781441966209 / 144196620X
- Weight 1 lbs (0.45 kg)
- Dimensions 9.2 x 6.1 x 0.7 in (23.37 x 15.49 x 1.78 cm)
-
Themes
- Aspects (Academic): Science/Technology Aspects
- Category Technology & Industrial Arts
- Library of Congress subjects Integrated circuits - Design and construction, Integrated circuits - Computer-aided design
- Library of Congress Catalogue Number 2011940313
- Dewey Decimal Code 621.381
- Quantity available 254
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From the publisher
From the rear cover
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.- Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
- Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
- Describes critical effects of process variation using simple examples that can be reproduced by the reader.
