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RELIABILITY MODELING, ANALYSIS AND OPTIMIZATION VOL-9

RELIABILITY MODELING, ANALYSIS AND OPTIMIZATION VOL-9

RELIABILITY MODELING, ANALYSIS AND OPTIMIZATION VOL-9
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RELIABILITY MODELING, ANALYSIS AND OPTIMIZATION VOL-9 Hardback - 2006

by PHAM

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  • Title RELIABILITY MODELING, ANALYSIS AND OPTIMIZATION VOL-9
  • Author PHAM
  • Binding Hardback
  • Condition New
  • Pages 508
  • Volumes 1
  • Language ENG
  • Publisher World Scientific Publishing Company
  • Publication date June 26, 2006
  • Illustrated Yes
  • Features Illustrated, Index, Table of Contents
  • Bookseller's Inventory # 9789812563880
  • ISBN 9789812563880 / 9812563881
  • Weight 1.91 lbs (0.87 kg)
  • Dimensions 9.08 x 6.3 x 1.24 in (23.06 x 16.00 x 3.15 cm)
  • Category Technology & Industrial Arts
  • Library of Congress Catalogue Number 2006283988
  • Dewey Decimal Code 620.004
  • Quantity available 96

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From the publisher

As our modern information-age society grows in complexity both in terms of embedded systems and applications, the problems and challenges in reliability become ever more complex. Bringing together many of the leading experts in the field, this volume presents a broad picture of current research on system modeling and optimization in reliability and its applications.The book comprises twenty-three chapters organized into four parts: Reliability Modeling, Software Quality Engineering, Software Reliability, and Maintenance and Inspection Policies. These sections cover a wide range of important topics, including system reliability modeling, optimization, software reliability and quality, maintenance theory and inspection, reliability failure analysis, sampling plans and schemes, software development processes and improvement, stochastic process modeling, statistical distributions and analysis, fault-tolerant performance, software measurements and cost effectiveness, queueing theory and applications, system availability, reliability of repairable systems, testing sampling inspection, software capability maturity model, accelerated life modeling, statistical control, and HALT testing.
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