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Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies
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Reliability Wearout Mechanisms in Advanced CMOS Technologies

by Stewart E. Rauch Timothy D. Sullivan Giuseppe La Rosa Jordi Sune Rolf–Peter Vollertsen Ernest Y. Wu Alvin W. Strong

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  • Hardcover
Condition
New
ISBN 10
0471731722
ISBN 13
9780471731726
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About This Item

John Wiley & Sons , pp. 624 . Hardback. New.

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Details

Bookseller
Cold Books US (US)
Bookseller's Inventory #
6612314
Title
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Author
Stewart E. Rauch Timothy D. Sullivan Giuseppe La Rosa Jordi Sune Rolf–Peter Vollertsen Ernest Y. Wu Alvin W. Strong
Format/Binding
Hardback
Book Condition
New
Quantity Available
4
Binding
Hardcover
ISBN 10
0471731722
ISBN 13
9780471731726
Publisher
John Wiley & Sons
Place of Publication
Piscataway, NJ
Date Published
pp. 624
LCCN
2011377262

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Cold Books

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About the Seller

Cold Books

Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Biblio member since 2012
Woodside, New York

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A new book is a book previously not circulated to a buyer. Although a new book is typically free of any faults or defects, "new"...
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