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Roadmap Of Scanning Probe Microscopy

Roadmap Of Scanning Probe Microscopy

Roadmap Of Scanning Probe Microscopy
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Roadmap Of Scanning Probe Microscopy Hardback - 2006

by Seizo Morita (Editor)

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New/New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!
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Details

  • Title Roadmap Of Scanning Probe Microscopy
  • Author Seizo Morita (Editor)
  • Binding Hardback
  • Edition U. S. EDITION
  • Condition New
  • Pages 201
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date 2006-10-26
  • Illustrated Yes
  • Features Illustrated, Index, Table of Contents
  • Bookseller's Inventory # BIBNN-91018
  • ISBN 9783540343141 / 3540343148
  • Weight 0.95 lbs (0.43 kg)
  • Dimensions 9.51 x 6.31 x 0.53 in (24.16 x 16.03 x 1.35 cm)
  • Category Technology & Industrial Arts
  • Library of Congress Catalogue Number 2006930878
  • Dewey Decimal Code 530.41
  • Quantity available 1

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Reader reviews for Roadmap Of Scanning Probe Microscopy

From the publisher

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

From the rear cover

Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

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