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Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists

Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists

Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists Hardback - 1992

by Dale E. Newbury; Patrick Echlin

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Springer, 1992. Hardcover. Good. Disclaimer:A copy that has been read, but remains in clean condition. All pages are intact, and the cover is intact. The spine may show signs of wear. Pages can include limited notes and highlighting, and the copy can include previous owner inscriptions. The dust jacket is missing. At ThriftBooks, our motto is: Read More, Spend Less.Dust jacket quality is not guaranteed.
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Details

  • Title Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists
  • Author Dale E. Newbury; Patrick Echlin
  • Binding Hardback
  • Edition 2nd
  • Condition Used - Good
  • Pages 840
  • Volumes 1
  • Language ENG
  • Publisher Springer, New York, New York, U.S.A.
  • Publication date 1992
  • Bookseller's Inventory # G0306441756I3N01
  • ISBN 9780306441752 / 0306441756
  • Weight 4.46 lbs (2.02 kg)
  • Dimensions 10.26 x 7.34 x 2.08 in (26.06 x 18.64 x 5.28 cm)
  • Category Science
  • Library of Congress subjects Scanning electron microscopy, X-ray microanalysis
  • Library of Congress Catalogue Number 92-9840
  • Dewey Decimal Code 550
  • Quantity available 1

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From the publisher

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities."

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