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Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
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Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits Hardback - 1993

by Christopher Michael

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Details

  • Title Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
  • Author Christopher Michael
  • Binding Hardback
  • Edition First Edition
  • Condition New
  • Pages 190
  • Volumes 1
  • Language ENG
  • Publisher Springer, Boston/Dordrecht/London
  • Publication date 1993-01-31
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • Bookseller's Inventory # 757948
  • ISBN 9780792392996 / 079239299X
  • Weight 1.05 lbs (0.48 kg)
  • Dimensions 9.21 x 6.14 x 0.5 in (23.39 x 15.60 x 1.27 cm)
  • Category Computers - General Information
  • Library of Congress Catalogue Number 92035702
  • Dewey Decimal Code 621.395
  • Quantity available 5

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Reader reviews for Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

From the publisher

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.
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