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Total Least Squares and Errors-in-Variables Modeling : Analysis, Algorithms and Applications

Total Least Squares and Errors-in-Variables Modeling : Analysis, Algorithms and Applications

Total Least Squares and Errors-in-Variables Modeling : Analysis, Algorithms and Applications Paperback - 2010

by S. Van Huffel (Editor); P. Lemmerling (Editor)

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Paperback. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it
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Details

  • Title Total Least Squares and Errors-in-Variables Modeling : Analysis, Algorithms and Applications
  • Author S. Van Huffel (Editor); P. Lemmerling (Editor)
  • Binding Paperback
  • Edition Softcover reprin
  • Condition New
  • Pages 398
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date 2010-12-01
  • Bookseller's Inventory # ria9789048159574_inp
  • ISBN 9789048159574 / 9048159571
  • Weight 1.26 lbs (0.57 kg)
  • Dimensions 9.21 x 6.14 x 0.84 in (23.39 x 15.60 x 2.13 cm)
  • Category Mathematics
  • Dewey Decimal Code 512.5
  • Quantity available 624

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From the publisher

In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it at the third international workshop on TLS and EIV modeling held in Leuven, Belgium, August 27-29, 2001. These invited papers, representing two-thirds of the book, together with a selection of other presented contributions yield a complete overview of the main scientific achievements since 1996 in TLS and Errors-In-Variables modeling. In this way, the book nicely completes two earlier books on TLS (SIAM 1991 and 1997). Not only computational issues, but also statistical, numerical, algebraic properties are described, as well as many new generalizations and applications. Being aware of the growing interest in these techniques, it is a strong belief that this book will aid and stimulate users to apply the new techniques and models correctly to their own practical problems.

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