BIBLIO is the largest independent book marketplace in the world, with over 100 million books.

Skip to content

X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems)

X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems)

X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and
Stock photo: cover may vary

X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems) Hardback - 2018

by Greenberg, Joel

Add to wish list
  • Used
  • very good
  • Hardback
  • first
Used - Very good

Description

Usa: CRC Press, 2018. 1st Edition. Hardcover. Very Good. 6x0x9. No Remarks Inside. 255 Pages With An Index. Hardcover, In Very Good Condition. Pictorial Boards. This Book Is Not Signed.- Specializing in academic, collectible and historically significant, providing the utmost quality and customer service satisfaction. For any questions feel free to email us.
Ask the seller a question Add to wish list
A$235.49
A$13.00 Delivery to USA
Standard delivery: 2 to 6 days
More delivery options
Ships from bmyguest books (United States)
Biblio Top Seller
The BIBLIO Guarantee

Details

  • Title X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems)
  • Author Greenberg, Joel
  • Binding Hardback
  • Edition 1st Edition
  • Condition Used - Very good
  • Pages 256
  • Volumes 1
  • Language ENG
  • Publisher CRC Press, Usa
  • Publication date 2018
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • Bookseller's Inventory # A29769a
  • ISBN 9781498783613 / 1498783619
  • Weight 0.13 lbs (0.06 kg)
  • Size 6x0x9
  • Category Technology & Industrial Arts
  • Library of Congress subjects Radiography, Industrial, Refractometers
  • Library of Congress Catalogue Number 2018027858
  • Dewey Decimal Code 620.112
  • Quantity available 1

About bmyguest books United States

Specialising in: Childrens, History, Modern First Editions, Philosophy, Religion, Science Fiction & Fantasy
Biblio member since 2004

Internet based used, old and rare book store. we ship from a US. address

Terms of Sale:

All prices in US Dollars, payable by Check or Money Order or Bidpay or paypal. Please specify what book you are paying for on the check. All sales are on first come first served basis apon confirmation. Books will be held for 2 weeks(14days) pending receipt of payment. NO LOCAL PICKUPS. Shipping: $5.00 for 1st book. $ 2.00 dollars for each additional book ordered on the same order within North America. Outside North America they will be shipped at cost of at least $10.00 US dollars. for European countries. Japan and others $15.00 US Dollars. All books will be shipped by air mail. More Secure methods of shipping are available at cost and must be pre-arranged. All books purchased are returnable within 10 days with prior notice. To ensure prompt service of your order please reference book title on your check. Please make all checks payable to : Monarchy Books 50 Leameadow Way, Toronto, Ontario. Canada M1B - 2P2 Please allow 2 to 4 weeks for delivery.

Browse books from bmyguest books

Reader reviews for X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems)

Write a review for this book

There are no reviews for this book yet. Be the first to write a review!

Your review will be anonymous unless you login or create an account first.

Overall rating
Remember: You’re rating the book as a work, not the seller or the condition of the specific copy you purchased!

Important Terms and Guidelines

  • Please focus on the book’s content and context. Also, add any personal comments as to how you enjoyed the book. Substantiate your likes and dislikes. You may make comparisons to other books.
  • Reviews must be at least 140 characters in length.
  • Please do not reveal critical plot elements.
  • This is not a help line. Contact customer support if you need help.
Your review must not include:
  • Obscenities, discriminatory language, or other insulting language not suitable for public domain
  • Advertisements, “spam” content, or references to other products, offers or websites.
  • Email addresses, URLs, phone numbers, physical addresses or other contact information.
  • Overly critical comments about other reviews or reviewers
  • Time-sensitive material (i.e. promotional tours, seminars, lectures, etc.)
  • Availability, price, or alternative ordering/shipping information

From the publisher

This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike.

  • Teaches novel methods for X-ray diffraction imaging

  • Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms

  • Features state-of-the-art work of international authors from both academia and industry.

  • Includes practical applications in the medical, industrial, and security sectors

About the author

Joel A. Greenberg received his B.S.E. in Mechanical and Aerospace Engineering from Princeton University in 2005, and his Ph.D. in physics from Duke University in 2012. He then joined the Duke Imaging and Spectroscopy Program in 2012 as a research scientist and technical/project manager of the computational adaptive X-ray imaging (CAXI) program. Since 2014, Joel has been an Assistant Research Professor of Electrical and Computer Engineering at Duke University and a member of the Fitzpatrick Institute for Photonics. He has published over 30 papers in the areas of nonlinear optics, cold atom physics, compressed sensing and X-ray imaging. His current research focuses on computational sensing and its application to security, medical, and industrial imaging and detection.

Please wait a moment while we load the requested page.

tracking-