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X-ray Multiple-wave Diffraction: Theory And Application (springer Series In Solid-state Sciences)

X-ray Multiple-wave Diffraction: Theory And Application (springer Series In Solid-state Sciences)

X-ray Multiple-wave Diffraction: Theory And Application (springer Series In
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X-ray Multiple-wave Diffraction: Theory And Application (springer Series In Solid-state Sciences) Hardback - 2004

by Shih-Lin Chang

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New/New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!
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Details

  • Title X-ray Multiple-wave Diffraction: Theory And Application (springer Series In Solid-state Sciences)
  • Author Shih-Lin Chang
  • Binding Hardback
  • Edition 1st
  • Condition New
  • Pages 436
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date 2004-06-24
  • Features Bibliography, Index
  • Bookseller's Inventory # BIBNNA-162558
  • ISBN 9783540211969 / 3540211969
  • Weight 1.78 lbs (0.81 kg)
  • Dimensions 9.21 x 6.14 x 1 in (23.39 x 15.60 x 2.54 cm)
  • Category Science
  • Library of Congress subjects X-rays - Diffraction, X-ray crystallography
  • Library of Congress Catalogue Number 2004045250
  • Dewey Decimal Code 548.83
  • Quantity available 1

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Reader reviews for X-ray Multiple-wave Diffraction: Theory And Application (springer Series In Solid-state Sciences)

From the publisher

X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two- or higher-dimensional structures, like 2-d and 3-d crystals and even quasi- crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in- volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X- ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure- ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver- sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.

From the rear cover

This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. X-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in X-ray diffraction.
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