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An Artificial Intelligence Approach to Test Generation
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An Artificial Intelligence Approach to Test Generation Hardback - 1987

by Narinder Singh

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Reader reviews for An Artificial Intelligence Approach to Test Generation

From the publisher

I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to thank Harold Brown for introducing me to the application of artificial intelligence to reasoning about designs, and his many valuable comments as a reader of this thesis. Significant contribu- tions by the other members of my reading committee, Mark Horowitz, and Allen Peterson have greatly improved the content and organization of this thesis by forcing me to communicate my ideas more clearly. I am extremely grateful to the other members of the Logic Group at the Heuristic Programming Project for being a sounding board for my ideas, and providing useful comments. In particular, I would like to thank Matt Ginsberg, Vineet Singh, Devika Subramanian, Richard Trietel, Dave Smith, Jock Mackinlay, and Glenn Kramer for their pointed criticisms. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence). I am grateful to Peter Hart, the former head of the AI lab, and his successor Marty Tenenbaum for providing an excellent environment for performing this research.

Details

  • Title An Artificial Intelligence Approach to Test Generation
  • Author Narinder Singh
  • Binding Hardback
  • Edition First edition
  • Pages 194
  • Volumes 1
  • Language ENG
  • Publisher Springer, Boston
  • Publication date 1987-02-28
  • ISBN 9780898381856 / 0898381851
  • Weight 1.08 lbs (0.49 kg)
  • Dimensions 9.28 x 6.52 x 0.94 in (23.57 x 16.56 x 2.39 cm)
  • Category Computers - General Information
  • Library of Congress subjects Artificial intelligence, Expert systems (Computer science)
  • Library of Congress Catalogue Number 86020892
  • Dewey Decimal Code 621.395

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An Artificial Intelligence Approach to Test Generation
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An Artificial Intelligence Approach to Test Generation

by Narinder Singh

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Kluwer Academic Publishers, 1987. Hardcover. Good. Former library book. Signs of wear on the cover. Different cover. Edition 1987. Ammareal gives back up to 15% of this item's net price to charity organizations.
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An Artificial Intelligence Approach to Test Generation
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An Artificial Intelligence Approach to Test Generation

by Singh, Narinder

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Boston: Kluwer Academic, 1987. First edition. Hardcover. Near Fine/No Jacket. 1987, First edition. 193 pp. Hardcover, 8vo., glossy white covers. Near Fine copy, covers show light soil. Clean, unmarked text. No DJ.
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An Artificial Intelligence Approach to Test Generation (The Springer International Series in...
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An Artificial Intelligence Approach to Test Generation (The Springer International Series in Engineering and Computer Science, 19)

by Singh, Narinder

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Springer, 1987-02-28. 1987. hardcover. Used: Good. 6.52x0.94x9.28. Buy with confidence. Excellent Customer Service & Return policy.
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by Singh, Narinder

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An Artificial Intelligence Approach to Test Generation (The Springer International Series in Engineering and Computer Science, 19)

by Singh, Narinder

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An Artificial Intelligence Approach to Test Generation

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