Home Microprobe Characterization of Optoelectronic Materials by Juan Jimenez (ISBN: 9781560329411)

Stock photo: cover may vary

Microprobe Characterization of Optoelectronic Materials Hardback - 2002 - 1st Edition

Name: Microprobe Characterization of Optoelectronic Materials
Price: 618.82 GBP
Availability: InStock
Author: Jimenez, Juan (Author)
ISBN: 9781560329411

by Juan Jimenez

Add to wish list

Browse more copies for sale ↓

Reader reviews for Microprobe Characterization of Optoelectronic Materials

Write a review for this book

Important Terms and Guidelines

Please focus on the book’s content and context. Also, add any personal comments as to how you enjoyed the book. Substantiate your likes and dislikes. You may make comparisons to other books.
Reviews must be at least 140 characters in length.
Please do not reveal critical plot elements.
This is not a help line. Contact customer support if you need help.

Your review must not include:

Obscenities, discriminatory language, or other insulting language not suitable for public domain
Advertisements, “spam” content, or references to other products, offers or websites.
Email addresses, URLs, phone numbers, physical addresses or other contact information.
Overly critical comments about other reviews or reviewers
Time-sensitive material (i.e. promotional tours, seminars, lectures, etc.)
Availability, price, or alternative ordering/shipping information

From the publisher

Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

First line

HASH(0x111394f0)

Details

Title Microprobe Characterization of Optoelectronic Materials
Author Juan Jimenez
Binding Hardback
Edition number 1st
Edition 1
Pages 730
Volumes 1
Language ENG
Publisher CRC Press
Publication date November 15, 2002
Illustrated Yes
Features Bibliography, Illustrated, Index, Table of Contents
ISBN 9781560329411 / 1560329416
Weight 2.49 lbs (1.13 kg)
Dimensions 9.46 x 6.16 x 1.78 in (24.03 x 15.65 x 4.52 cm)
Library of Congress subjects Microprobe analysis, Semiconductors - Optical properties
Library of Congress Catalogue Number 2001053158
Dewey Decimal Code 537.622

About the author

Juan Jimnez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.

More Copies for Sale

Stock photo: cover may vary