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An Introduction to Logic Circuit Testing
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An Introduction to Logic Circuit Testing Paperback - 2008

by Parag K. Lala

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From the publisher

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.

Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Details

  • Title An Introduction to Logic Circuit Testing
  • Author Parag K. Lala
  • Binding Paperback
  • Pages 112
  • Volumes 1
  • Language ENG
  • Publisher Morgan & Claypool
  • Publication date 2008-11
  • ISBN 9781598293500 / 1598293508
  • Weight 0.45 lbs (0.20 kg)
  • Dimensions 9.25 x 7.5 x 0.23 in (23.50 x 19.05 x 0.58 cm)
  • Category Computers - General Information
  • Dewey Decimal Code 621.395

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An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems, 17)
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An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems, 17)

by Lala, Parag K

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  • Paperback
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ISBN 10 / ISBN 13
9781598293500 / 1598293508
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Morgan & Claypool Publishers, 04/11/2008. paperback. Used: Good. 7.50x0.25x9.25. Buy with confidence. Excellent Customer Service & Return policy.
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A$60.84
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An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems, 17)
Stock photo: cover may vary

An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems, 17)

by Lala, Parag K.

  • Used
  • Good
  • Paperback
Condition
Good
Binding
Paperback
ISBN 10 / ISBN 13
9781598293500 / 1598293508
Quantity available
1
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Item price
A$113.64
Free Delivery to USA

Show details

Description:
paperback. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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Item price
A$113.64
Free Delivery to USA