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Test-Driven Development for Embedded C Paperback - 2011 - 1st Edition
by James W. Grenning
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Grenning shows embedded software developers how to bring the benefits of TDD to embedded C. Readers will see how to apply TDD to C and the world of embedded software development.
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Details
- Title Test-Driven Development for Embedded C
- Author James W. Grenning
- Binding Paperback
- Edition number 1st
- Edition 1
- Pages 356
- Volumes 1
- Language ENG
- Publisher Pragmatic Bookshelf, U.S.A.
- Publication date 2011-05-31
- Features Bibliography, Index, Price on Product - Canadian, Table of Contents
- ISBN 9781934356623 / 193435662X
- Weight 1.29 lbs (0.59 kg)
- Dimensions 8.97 x 7.53 x 0.8 in (22.78 x 19.13 x 2.03 cm)
- Category Computers - Languages / Programming
- Library of Congress subjects C (Computer program language), Application software - Development
- Dewey Decimal Code 005.12
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Citations
- Reference and Research Bk News, 08/01/2011, Page 202
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