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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and
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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability Hardback - 2002

by David J. Dumin (Editor)

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Reader reviews for Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

From the publisher

This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.

First line

The metal-oxide-semiconductor (MOS) transistor was invented in 1960 [1, 2].

Details

  • Title Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability
  • Author David J. Dumin (Editor)
  • Binding Hardback
  • Pages 280
  • Volumes 1
  • Language ENG
  • Publisher World Scientific Publishing Company
  • Publication date January 31, 2002
  • ISBN 9789810248420 / 9810248423
  • Weight 1.38 lbs (0.63 kg)
  • Dimensions 10.08 x 6.7 x 0.77 in (25.60 x 17.02 x 1.96 cm)
  • Category Technology & Industrial Arts
  • Library of Congress Catalogue Number 2002279812
  • Dewey Decimal Code 621

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OXIDE RELIABILITY: A SUMMARY OF SILICON OXIDE WEAROUT, BREAKDOWN, AND RELIABILITY VOL-23
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OXIDE RELIABILITY: A SUMMARY OF SILICON OXIDE WEAROUT, BREAKDOWN, AND RELIABILITY VOL-23

by DUMIN

  • New
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New
ISBN 10 / ISBN 13
9789810248420 / 9810248423
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A$151.71
A$17.94 Delivery to USA

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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Selected...
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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Selected Topics in Electronics and Systems)

by Dumin, David J (Editor)

  • Used
  • Hardback
Condition
Used
Binding
Hardcover
ISBN 10 / ISBN 13
9789810248420 / 9810248423
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1
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A$212.71
A$7.08 Delivery to USA

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Description:
Hardcover. Book Condition: Fine. Jacket Condition: Very Good. World Scientific Publishing Company, 2002. 280 pages. Nice Firm Clean copy ! Jacket has 1 short tear. Size: 10 x 6.7 x 0.7. Engineering Science/Nature::Chemistry 6039L
Add to wish list
Item price
A$212.71
A$7.08 Delivery to USA
Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Selected...
Stock photo: cover may vary

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Selected Topics in Electronics and Systems)

by Dumin, David J (Editor)

  • Used
  • Fine
  • Hardback
Condition
Excellent
Binding
Hardcover
ISBN 10 / ISBN 13
9789810248420 / 9810248423
Quantity available
1
Seller
Item price
A$221.79
Free Delivery to USA

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Description:
World Scientific Publishing Company, 2002. Hardcover. Fine.
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Item price
A$221.79
Free Delivery to USA