Failure Analysis of Integrated Circuits : Tools and Techniques Hardback - 1999
by Lawrence C. Wagner (Editor)
- New
- Hardback
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A$15.59
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Details
- Title Failure Analysis of Integrated Circuits : Tools and Techniques
- Author Lawrence C. Wagner (Editor)
- Binding Hardback
- Edition 1st
- Condition New
- Pages 255
- Volumes 1
- Language ENG
- Publisher Springer
- Publication date 1999-01-31
- Illustrated Yes
- Features Bibliography, Illustrated, Index
- Bookseller's Inventory # ria9780412145612_inp
- ISBN 9780412145612 / 0412145618
- Weight 1.3 lbs (0.59 kg)
- Dimensions 9.48 x 6.42 x 0.87 in (24.08 x 16.31 x 2.21 cm)
- Category Technology & Industrial Arts
- Library of Congress subjects Semiconductors - Failures, Integrated circuits - Testing
- Library of Congress Catalogue Number 98051769
- Dewey Decimal Code 621.381
- Quantity available 671
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From the publisher
First line
Failure analysis can be defined as a diagnostic process for determining the cause of a failure.