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Failure Analysis of Integrated Circuits: Tools and Techniques
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Failure Analysis of Integrated Circuits: Tools and Techniques Hardback - 1999

by Lawrence C. Wagner (Editor)

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From the publisher

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques is a must have' reference work for semiconductor professionals and researchers.

First line

Failure analysis can be defined as a diagnostic process for determining the cause of a failure.

Details

  • Title Failure Analysis of Integrated Circuits: Tools and Techniques
  • Author Lawrence C. Wagner (Editor)
  • Binding Hardback
  • Edition 1st
  • Pages 255
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date 1999-01-31
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • ISBN 9780412145612 / 0412145618
  • Weight 1.3 lbs (0.59 kg)
  • Dimensions 9.48 x 6.42 x 0.87 in (24.08 x 16.31 x 2.21 cm)
  • Category Technology & Industrial Arts
  • Library of Congress subjects Semiconductors - Failures, Integrated circuits - Testing
  • Library of Congress Catalogue Number 98051769
  • Dewey Decimal Code 621.381
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Failure Analysis of Integrated Circuits : Tools and Techniques
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Failure Analysis of Integrated Circuits : Tools and Techniques

by Wagner, Lawrence C.

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ISBN 10 / ISBN 13
9780412145612 / 0412145618
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Springer. Very Good. 1999. Hardcover. 0412145618 . This book is in very good condition; no remainder marks. It does have some cover shelfwear. Some scraping inside front cover from removal of a stubborn book plate. Inside pages are clean. ; The Springer International Series In Engineering And Computer Science, 494; 268 pages .
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series...
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)

by Wagner, Lawrence C

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1999
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Springer, 1999-01-31. 1999. hardcover. Used: Good. 6.42x0.87x9.48. Buy with confidence. Excellent Customer Service & Return policy.
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Failure Analysis of Integrated Circuits : Tools and Techniques

Failure Analysis of Integrated Circuits : Tools and Techniques

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Hardcover. New. New Book; Fast Shipping from UK; Not signed; Not First Edition; This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root caus
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series...
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)

by Wagner, Lawrence C

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  • Hardback
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Edition
1999
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ISBN 10 / ISBN 13
9780412145612 / 0412145618
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Springer, 1999-01-31. 1999. hardcover. New. 6.42x0.87x9.48. Buy with confidence. Excellent Customer Service & Return policy.
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series...
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science (494))

by Wagner, Lawrence C. [Editor]

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Springer, 1999-01-31. Hardcover. New. In shrink wrap. Looks like an interesting title!
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series...
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494, Band 494) Wagner Lawrence, C.

by Wagner Lawrence, C.

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1999
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Springer, 1999. 1999. Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494, Band 494) Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494, Band 494) Wagner Lawrence, C.
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Failure Analysis of Integrated Circuits
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Failure Analysis of Integrated Circuits

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Springer , pp. 276 . Hardback. New.
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