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Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits
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Failure Analysis of Integrated Circuits Hardback -

by Lawrence C. Wagner (Editor)

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Springer , pp. 276 . Hardback. New.
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Details

  • Title Failure Analysis of Integrated Circuits
  • Author Lawrence C. Wagner (Editor)
  • Binding Hardback
  • Edition 1st
  • Condition New
  • Pages 255
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date pp. 276
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index
  • Bookseller's Inventory # 6316325
  • ISBN 9780412145612 / 0412145618
  • Weight 1.3 lbs (0.59 kg)
  • Dimensions 9.48 x 6.42 x 0.87 in (24.08 x 16.31 x 2.21 cm)
  • Category Technology & Industrial Arts
  • Library of Congress subjects Semiconductors - Failures, Integrated circuits - Testing
  • Library of Congress Catalogue Number 98051769
  • Dewey Decimal Code 621.381
  • Quantity available 4

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From the publisher

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques is a must have' reference work for semiconductor professionals and researchers.

First line

Failure analysis can be defined as a diagnostic process for determining the cause of a failure.

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