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High Resolution X-Ray Diffractometry and Topography

High Resolution X-Ray Diffractometry and Topography

High Resolution X-Ray Diffractometry and Topography
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High Resolution X-Ray Diffractometry and Topography Hardback - 1998 - 1st Edition

by Bowen, D. K. & Brian K. Tanner

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Description

CRC Press. Very Good. 1998. Hardcover. 0850667585 . Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean. ; 24.6 X 17.4 X 1.56 centimeters; 264 pages .
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Details

  • Title High Resolution X-Ray Diffractometry and Topography
  • Author Bowen, D. K. & Brian K. Tanner
  • Binding Hardback
  • Edition number 1st
  • Edition 1
  • Condition Used - Very good
  • Pages 262
  • Volumes 1
  • Language ENG
  • Publisher CRC Press, London and New York
  • Publication date 1998
  • Features Maps
  • Bookseller's Inventory # 06SA24-659-209
  • ISBN 9780850667585 / 0850667585
  • Weight 1.16 lbs (0.53 kg)
  • Dimensions 9.56 x 6.4 x 0.83 in (24.28 x 16.26 x 2.11 cm)
  • Category Science
  • Library of Congress subjects Crystals, X-rays - Diffraction
  • Library of Congress Catalogue Number 98136331
  • Dewey Decimal Code 548.83

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From the publisher

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

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