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High Resolution X-Ray Diffractometry and Topography Hardback - 1998 - 1st Edition
by D. K. Bowen; Brian K. Tanner
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Details
- Title High Resolution X-Ray Diffractometry and Topography
- Author D. K. Bowen; Brian K. Tanner
- Binding Hardback
- Edition number 1st
- Edition 1
- Pages 262
- Volumes 1
- Language ENG
- Publisher CRC Press, London and New York
- Publication date 1998-02-05
- Features Maps
- ISBN 9780850667585 / 0850667585
- Weight 1.16 lbs (0.53 kg)
- Dimensions 9.56 x 6.4 x 0.83 in (24.28 x 16.26 x 2.11 cm)
- Category Science
- Library of Congress subjects Crystals, X-rays - Diffraction
- Library of Congress Catalogue Number 98136331
- Dewey Decimal Code 548.83
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High Resolution X-Ray Diffractometry and Topography
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High Resolution X-Ray Diffractometry and Topography
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