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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) Hardback - 2006
by Foster, Adam; Hofer, Werner A
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- Hardback
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Details
- Title Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
- Author Foster, Adam; Hofer, Werner A
- Binding Hardback
- Edition 1st
- Condition New
- Pages 282
- Volumes 1
- Language ENG
- Publisher Springer
- Publication date 2006-06-28
- Illustrated Yes
- Bookseller's Inventory # Q-0387400907
- ISBN 9780387400907 / 0387400907
- Weight 1.31 lbs (0.59 kg)
- Dimensions 9.25 x 6.1 x 0.69 in (23.50 x 15.49 x 1.75 cm)
- Category Technology & Industrial Arts
- Library of Congress subjects Scanning probe microscopy
- Library of Congress Catalogue Number 2005936713
- Dewey Decimal Code 502.82
- Quantity available 1
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From the publisher
From the rear cover
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
