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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Hardback - 2006

by Adam Foster; Werner A. Hofer

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From the publisher

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.

Key Features

  • Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
  • Provides a framework for linking scanning probe theory and simulations with experimental data
  • Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations

From the rear cover

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Details

  • Title Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
  • Author Adam Foster; Werner A. Hofer
  • Binding Hardback
  • Edition 1st
  • Pages 282
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Publication date June 28, 2006
  • Illustrated Yes
  • ISBN 9780387400907 / 0387400907
  • Weight 1.31 lbs (0.59 kg)
  • Dimensions 9.25 x 6.1 x 0.69 in (23.50 x 15.49 x 1.75 cm)
  • Category Technology & Industrial Arts
  • Library of Congress subjects Scanning probe microscopy
  • Library of Congress Catalogue Number 2005936713
  • Dewey Decimal Code 502.82
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SCANNING PROBE MICROSCOPY, ATOMIC SCALE ENGINEERING BY FORCES AND CURRENTS
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SCANNING PROBE MICROSCOPY, ATOMIC SCALE ENGINEERING BY FORCES AND CURRENTS

by FOSTER, ADAM, HOFER, WERNER,

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SCANNING PROBE MICROSCOPY, ATOMIC SCALE ENGINEERING BY FORCES AND CURRENTS
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SCANNING PROBE MICROSCOPY, ATOMIC SCALE ENGINEERING BY FORCES AND CURRENTS

by FOSTER, ADAM, HOFER, WERNER,

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and...
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by Foster, Adam

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Scanning Probe Microscopy, Atomic Scale Engineering By Forces And Currents
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Scanning Probe Microscopy, Atomic Scale Engineering By Forces And Currents

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Scanning Probe Microscopy, Atomic Scale Engineering By Forces And Currents
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Scanning Probe Microscopy, Atomic Scale Engineering By Forces And Currents

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and...
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and...
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

by Foster, Adam; Hofer, Werner A

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Scanning Probe Microscopy
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Scanning Probe Microscopy

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SCANNING PROBE MICROSCOPY (HB 2006)

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Scanning Probe Microscopy, Atomic Scale Engineering By Forces And Currents
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Scanning Probe Microscopy, Atomic Scale Engineering By Forces And Currents

by Foster, Adam, Hofer, Werner,

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